Tilt illumination for structured illumination imaging
نویسندگان
چکیده
To achieve super-resolution imaging, the information in higher frequency of observed sample is collected by illuminating with a structure beam for limited optical transfer function. In this paper, tilt illumination mode introduced to structured microscopy (SIM) enhancing lateral resolution. More spectrum more than traditional SIM, can be obtained detector. Thus, SIM improved at aspect imaging
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ژورنال
عنوان ژورنال: Optical and Quantum Electronics
سال: 2021
ISSN: ['1572-817X', '0306-8919']
DOI: https://doi.org/10.1007/s11082-021-03174-6